Ultisa Labs specializes in analytical services for semiconductor applications and high-purity chemical manufacturers. Identification of impurities in semiconductor process chemicals and ultrapure water is vital to provide the data and information required to improve manufacturing processes and maximize product yield. Ultisa utilizes the most advanced automation to provide the quickest and most accurate analytical testing for the most critical applications. Ultisa technology and support provides rapid results for both routine and unique semiconductor applications, with flexibility to provide the fastest results and the capability to develop custom solutions for any process.
In semiconductor manufacturing, every atom matters. Yield, reliability, and performance depend on controlling contamination at the parts-per-trillion (ppt) level. Our laboratory specializes in ultra-low level metals analysis using ICPMS and Vapor Phase Decomposition (VPD) ICPMS to detect, quantify, and verify impurities across critical materials and wafer surfaces.
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We provide comprehensive semiconductor analysis services tailored to support advanced logic, memory, and foundry fabs, delivering fast, accurate, and actionable results to meet the demanding quality standards of today’s semiconductor manufacturing.
Ultisa supports testing in the development and production of high-performance solar cells and advanced display technologies, helping to optimize materials, improve process control, and accelerate innovation in both energy and display applications.
Ultisa has the expertise accelerates innovation and quality control in fields including microelectronics, nanofabrication, and emerging semiconductor technologies, helping clients improve process yield, reliability, and device functionality.
Utilizing ultra-trace detection methods and state-of-the-art instrumentation, we deliver advanced analytical solutions to ensure the highest standards of purity and quality in critical process chemicals used for semiconductor manufacturing.
Ultisa offers a comprehensive range of capabilities and flexible laboratory testing packages designed to meet the diverse needs of the semiconductor industry. Whether clients require routine batch testing or specialized consulting and troubleshooting, our state-of-the-art labs provide comprehensive reports, fast turnaround, and expert support to optimize device performance and ensure product quality throughout the semiconductor lifecycle.
To make it simple for fabs, suppliers, and R&D teams to get the data they need, we offer a suite of semiconductor-grade ICP-MS trace metals analysis packages and detection limits. Each package is designed to match common industry requirements of critical contaminants such as Na, Mg, Al, Ca, K, Fe, and Zn. Whether you need specialized analysis for known problem elements or full-spectrum metals screening for process qualification, our packages provide the flexibility, sensitivity, and reliability your operation demands.
Analysis Grade | Detection Limits |
---|---|
PPB Chemical Clean Chemical Ultrapure PPQ Ultrapure |
>1 ppb <100 ppt <10 ppt <1 ppt |
Metals Packages | Elements Included |
---|---|
Basic Environmentals (up to 18 metals) |
Na, Mg, Al, K, Ca, Cr, Mn, Fe, Ni, Co, Zn, As, Sr, Ag, Cd, Sn, Ba, Pb |
Semi Standard (up to 41 metals) |
Li, B, Na, Mg, Al, Si, K, Ca, Ti, V, Cr, Mn, Fe, Ni, Co, Zn, Ga, Ge, As, Rb, Sr, Zr, Nb, Mo, Ag, Cd, In, Sn, Sb, Cs, Ba, Hf, W, Ta, Ir, Au, Tl, Pb, Bi, Th, U |
Full COA (up to 69 metals) |
Semi Standard Elements + P, Sc, Se, Y, Ru, Rh, Pd, Te, La, Ce, Pr, Nd, Pm, Sm, Eu, Gd, Tb, Dy, Ho, Er, Tm, Yb, Lu, Re, Os, Pt, Hg |
As device architectures shrink and material purity requirements tighten, detecting metals at the single nanoparticle level has become essential for advanced semiconductor manufacturing. Our single nanoparticle (spICP-MS) analysis packages provide unparalleled insight into both particle size distribution and sub-ppt particle concentrations.
Elements | Minimum Detectable Particle Size (nm) |
---|---|
Al Si Ti Cr Fe Ni Cu Zn Ag Sn |
<10 nm <100 nm <10 nm <10 nm <10 nm <15 nm <10 nm <15 nm <10 nm <10 nm |
Minimum Detectable Concentration Packages | Minimum Detectable Particle Concentration (particles/L) |
---|---|
Ultra Low Low Standard |
<105 <107 <107 |
For the most sensitive wafer surface contamination studies, we provide a range of Vapor Phase Decomposition (VPD) ICPMS analysis packages tailored to semiconductor manufacturing needs. Whether you require a rapid contamination check for incoming wafers, an extended element panel for process troubleshooting, or a comprehensive full-spectrum analysis for supplier qualification, our VPD-ICPMS services give you the clarity and confidence to control yield-critical metals.
Metals Packages | Elements Included |
---|---|
Basic Environmentals | Na, Mg, Al, K, Ca, Cr, Mn, Fe, Ni, Co, Zn, As, Sr, Cd, Sn, Ag, Ba, Pb |
Semi Standard | Li, Na, Mg, Al, Si, K, Ca, Ti, V, Cr, Mn, Fe, Ni, Co, Zn, Ga, Ge, As, Rb, Sr, Zr, Nb, Mo, Ag, Cd, In, Sn, Sb, Cs, Ba, Hf, W, Ta, Tl, Pb, Bi, Th, U |
Full COA | Semi Standard Elements + B, P, Sc, Se, Y, Te, La, Ce, Pr, Nd, Pm, Sm, Eu, Gd, Tb, Dy, Ho, Er, Tm, Yb, Lu, Re, Hg |
Contamination control starts long before the sample reaches the instrument. Our laboratory offers specialized high-purity bottle cleaning services to ensure every container you use is free from trace metal residues and organic contaminants. We prepare bottles that meet the stringent requirements of semiconductor, pharmaceutical, and environmental testing labs. Whether for ultra-low level ICP-MS analysis, VPD wafer testing, or high-purity chemical storage, our cleaning service provides the confidence that your containers will never compromise your results.
On request Ultisa will provide precleaned and barcoded sampling bottles to ensure your testing needs are met without complications from contamination or mislabeling.
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